The IMPORTANCE OF LONG TERM AND STRESS TESTS IN IOT EMBEDDED SOFTWARE DEVELOPMENT

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Integration Test Phase of IoT Devices

The integration test phase of IoT devices is the final and the most important part of the development cycle of any IoT device. It ensures that the design is done as described in the requirements and also that the user will have the best experience – the main goal of any product.


Testing success and failure scenarios of the product life cycle involves not only thinking about all the user or subsystem interactions, but also about how to reproduce them in the test bench or emulation environment. During the design phase, usually the first part of product development, it is crucial to consider means which trigger all the possible event combinations and check the behavior of the system in an agile way. Considering the long term and stress test is also an important approach to catch memory issues and resources contention.

Webinar Overview

In this session, Concept Reply highlights the best practices developed in the embedded software team to ensure the testability of the devices from the design phase onwards. Using long term tests which stimulate different interfaces at the same time (e.g. WiFi, BLE, Serial), it is possible to prevent deadlocks, memory leaks and unexpected behavior during the product life cycle. Join this webinar and profit from the experts' experience in long term tests and their design for testability approach.

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    CONCEPT REPLY

    Concept Reply is the hardware and software development partner of the Reply Group specialized in IoT innovation. It offers solutions in the areas of Smart Infrastructure, Industrial IoT and Connected Vehicle. From the initial idea through the concept phase to implementation, operation and support. The company's numerous IoT specialists cover everything from hardware design and development to software implementation in embedded environments to edge computing software or cloud applications.